Test Vision 2020: The Next Step to Intelligent Test (Day 1)

Moscone North, Room 20 Wednesday, July 11
8:00am to 3:00pm

The growth in autonomous driving and "everything connected" is spurring  demand for semiconductors. Due to both higher coverage requirements and lower average selling prices the trend is putting greater pressure on test costs. Test must become smarter to address increased quality demands, while at the same time remain economical.

Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher performance analog, and increasing RF complexity. To address these challenges, all tools in the arsenal must be brought to bear, including increasing test instrumentation integration, smarter test strategies, self-test, adaptive test, system-level test, and more sophisticated test hardware.

At Test Vision 2020, we’ll ask: What can we do differently to provide testing cost effectively with dppm rates approaching zero? What R&D tools are needed for today’s and tomorrow’s devices? What will test cell (ATE, fixtures, handlers or probers, and probe cards) look like beyond 2018? How can test be better integrated into the manufacturing process?

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