Test Vision 2020 is today's premier workshop for semiconductor and system test experts with a vision towards the future of test. It is a highly anticipated gathering of providers and users of test IP and equipment, all converging to engage with leaders in the field and discuss coming trends and requirements. The conference typically has hundreds of participants and is held in conjunction with SEMICON West, assuring access to a wide range of expertise and experience.
This year’s workshop theme is Fast-Track to a Smarter Test. The growth in autonomous driving and everything connected is increasing demand for automotive semiconductors and putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining economical. Greater computational power coupled with increased analog and sensor content will force changes in test strategies due to more advanced packaging, heterogeneous integration, higher-performance analog, and increasing RF frequencies. To address these challenges, every tool in the arsenal must be brought to bear: increasing instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware.