Hosted by the SEMI Semiconductor, Components, Instruments, and Subsystems (SCIS) Technology Community
Sub-10nm is a reality in today’s manufacturer of devices but face major issues reaching entitled yields due to defects. Finding those defects, tracing them to their source, and eliminating them hinders from achieving any level of yield management that assure economic scales of investments. That in itself has led to focusing on one of the last frontiers never before reflected in the search of these defects -- sub-components. Bringing awareness to the correlation of particle or defect generation to these components has become a true priority. In this session, IDMs will share their perspectives on the impact of components on defectivity, cost and tool uptime. Furthermore, playing a similarly critical role and facing similar challenges, OEMs will share their insight on this critical issue and what they are doing with their component suppliers to solve these problems. These stakeholders are working together towards creating measurable and tangible solutions by characterizing important parameters affecting processes and inevitably impacting yields and productivity and offer ways to measure and manage them. Presenters in this session will offer their insight as well as answer questions on how this effort can bring meaningful improvements and impact to one of the last frontiers of the industry.