Test Vision 2020
July 15-16, 2015

Moscone North, Hall E, Room 131

 

 

Workshop Parnter:


        

  Technical Sponsor:

 

          

    Press Partner:

 

 

 

Test Vision 2020, formerly ATE Vision, has emerged as the premier workshop in the area of Automated Test Equipment. Attracting record attendance from a broad cross-section of the semiconductor community, the workshop features a compelling line-up of papers, keynotes and panel participation from leaders in the industry.

Test Vision 2020 (formerly ATE Vision) is today’s premier workshop for experts in the fields of semiconductor and system test. It’s a high-quality gathering of providers and users of test IP and test equipment, converging to engage with industry leaders to build a “20/20” view of our field’s future.

For 2015, we will have extra emphasis around the “Internet” part of the IoT. We will examine how new devices and technologies that support the next wave of internet expansion are challenging assumptions and strategies for test developed while the internet was merely connecting computers, smartphones, and tablets.


 

 

Agenda

Wednesday, July 15

 

1:00pm-1:30pm    Registration
 
1:30pm-1:35pm

Welcome Remarks

General Chair: Steve Tilden, Tilden Consulting

   
1:35pm-1:40pm Presentation of 2014 Best Paper Award
Ben Brown, Xcerra
 
1:40pm-1:45pm Program Review
Program Chair: Rick Marshall, Cascade Microtech
 
1:45pm-2:45pm  

Keynote: “How the Era of the IoT will Impact
the Semiconductor & Cloud Markets”
 

Kaivan Karimi (Biography)
VP & GM of Wireless Solutions
Atmel

 
2:45pm-3:00pm Break
 
Session 1:   Wireless Test in the IoT Era
 
3:00pm–3:20pm

1.1 Dropping the Dime on Low Cost RF Test

John Shelley, Xcerra
    
3:20pm– 3:40pm

1.2 Developing a Low Cost Test Solution for RF SoCs

Paul Berndt, Cypress Semiconductor
   
3:40pm– 4:00pm

1.3 Second Generation Produciton ATE Solution for Microwave and
Millimeter Wave Automotive Radar

Devin Morris, Roos Instruments
 
4:00pm-5:00pm Panel Session 1:
"What Does RF Test Look Like in Five Years?"
Future Solutions for Lowering the Cost of Transceiver Tests
 
Moderator: Mark Roos, Roos Instruments
Panelists:
  • Paul Berndt, Cypress Semiconductor
  • Gerard John, Amkor
  • Brad Robbins , LitePoint
  • John Shelley, Xcerra
 
5:00pm-6:30pm Test Vision 2020 Reception and Poster Session (Room 130) 
 
Thursday, July 16
 
8:00am- 9:00am Invited Speaker:

The LTE Era: Innovation Through Evolution, The Wireless
Transformation from Smart to Genius and Beyond…”
 

Brad Shaffer (Biography)
Senior Analyst, Mobile Electronics

IHS Technology

 
9:00am-9:10am Break
 
Session 2:   Test Flows and Tools for Today’s New Cost Challenges
 
9:10am-9:30am

2.1 Lean Kanban for Test Development

Jonathan Boyce & Shawn Ironmonger, AMD
 
9:30am-9:50am 2.2 Partitioning Test Between Massively Parallel DFT Tester and
ATE and Using a Baggage Handling System to Reduce Cost and
Complexity of Test

Alberto Salamone, ELES Semiconductor

 

 
9:50am-10:10am

2.3 What does “Big Data” really mean for Manufacturing Test?

Michael Schuldenfrei, Optimal+
 
10:10am-10:30am

2.4 Applying Data Providence and Security to RITdb

Mark Roos, Roos Instruments
                              

 

10:30am-10:45am   
Break


 

 

10:45am-11:45am

Invited Speaker:

Sensor Test Challenges and Outlook

 

Thomas Burger (Biography)
Director Test Development, Sr. Manager Test Technology

ams AG 

   

 

11:45am-1:00pm Networking Lunch (Power Lunch, North Hall)

 

SESSION 3:   Advanced Packaging, Advanced Test Challenges
 

 

1:00pm-1:20pm

3.1  High Performance HBM Known Good Stack Testing

Marc Loranger, FormFactor
 
1:20pm-1:40pm

3.2  WLP Post-Singulation Test Handling Trends and Challenges

Serge Kuenzli, COHU/Ismeca
 
1:40pm-2:00pm

3.3  Automated Testing for Bare Die-to-Die Stacks

Jörg Kiesewetter, Cascade Microtech
 
2:00pm-2:20pm

3.4 
Final Test Solution of WLCSP Devices

Laurie Wright, Xcerra
 

 

2:20pm-2:30pm Break


 

 

2:30pm-3:45pm

Panel Session 2:
"How Secure is Your Test Data,Really?"
Risks and Best Defenses Against Damaging Data Leaks

Moderator: Stacy Ajouri, Texas Instruments

Panelists:

  • Andy Evans, Broadcom
  • Ken Harris, PDF Solutions            
  • Gerard John, Amkor
  • Mike Rodgers, Reach IPS
  • Mark Roos, Roos Instruments
3:45pm-4:00pm Closing Remarks
General Chair: Steve Tilden, Tilden Consulting


 

 

Test Vision 2020 Program Committee

 

Test Vision 2020 Steering Committee

 


 

Who Should Attend

  • - Semiconductor Test and Product Engineers/Managers
    - Test equipment users and developers
    - Analysts

Registration

By June 6 After June 6
SEMI Member $253
$337
Non Member $337
$449

 

 

How to Register for this Program

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        If you are already registered for SEMICON West, visit www.semiconwest.org/rrc to log in to the Registration Resource Center.  Select "Agenda Builder" to add this program.

 

Sponsorship

 

 Platinum Sponsors
 
Advantest Logo
 

 

Gold Sponsors

 
 
  

 

 

Silver Sponsors
 
 
       
    

   
Roos Instruments Synopsys logo

 

For sponsorship opportunities, please contact:

Ken Lanier, Teradyne 

Test Vision 2020 Sponsoring Chair

Email: ken.lanier@teradyne.com 

 

 

 

 

 

 



 


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