San Francisco Marriott Marquis

Golden Gate Ballroom A, Golden Gate Level

Test Vision 2020, formerly ATE Vision, has emerged as the premier workshop in the area of Automated Test Equipment.  Attracting record attendance from a broad cross-section of the semiconductor community, the workshop features a compelling line-up of papers, keynotes and panel participation from leaders in the industry.

This year, once again the workshop will be held with SEMICON West and will examine where the test industry is heading and provide a forum for discussing the directions and solutions for emerging problems.

• Keynote Address:  Erik Volkerink, Chief Technology Officer, Flextronics
• Panel:  “How Much Test Is Enough Test?”
  Moderator: Greg Smith, Teradyne
  Panelists to be announced
  
  A firing line type panel that will attempt to answer the question of what is sufficient test     coverage, and how do we maintain this coverage given the ever increasing circuit densities of our continuously growing SoCs.
• 6:00pm-7:00pm  Networking Social hour

Thursday

July 11

8:00am-4:30pm

• Panel:  “The Next Big Innovation in Test”
  Moderator: Roger Barth, Micron Technology
  Panelists to be announced
  
  A time capsule panel that will attempt to predict the most profound changes in
  semiconductor testing across the industry over the next 10 years, and the expected impact  these innovations will have on the industry overall.  The thoughts of the panel and the     audience will be “dug-up” at a future Test Vision 2020 workshop to see just how well today’s industry leaders can predict the future.
• More Speakers to be announced
  
  For more information, visit the conference website: Test Vision 2020

How to Register for this Program

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