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Semiconductor Test: Smarter, Faster, More Productive

Tuesday, July 9, 2013
1:30pm
–4:00pm
North Hall, Moscone Center

                  Session Sponsor:

 

Description

While some may be hopelessly waiting for a reduction in the capital cost of test equipment, most test professionals are exploring ways to improve test accuracy, increase overall equipment efficiency, better integrate ATE into the yield ramp and Total Quality Management systems, and solve difficult test problems in 3DIC and other new devices.  This session will explore the latest trends and developments to improve yield, advances in probe card technology, adaptive test integration, and 3DIC test.

     

 

1:30pm-1:55pm Test Data–A Key Asset for Effective Yield Learning
(Presentation in PDF)


Martin Keim, Ph.D.
(Biography)                 
Technical Marketing Engineer, Silicon Test Solutions

Mentor Graphics Corporation
 
1:55pm-2:20pm

Big Data Breakthrough at Top 5 Fabless Companies
(Presentation in PDF)

 

Danny Glotter (Biography)

CEO & Founder
OptimalTest

 

 
2:20pm-2:45pm

New ATE Instrument for PCI-Express Protocol Testing
(Presentation in PDF)


Angarai Sivaram
(Biography)
Member, COE Group
Advantest

  
2:45pm-3:10pm

Increasing Test Coverage and Speed with USer-Programmable FPGA's in Semiconductor ATE

(Presentation in PDF)


Luke Schreier
(Biography)
Senior Group Manager, Automated Test Platform Marketing
National Instruments

 
3:10pm-3:35pm

Quality in 3D Assembly: Is KGD Good Enough
(Presentation in PDF)


James Quinn
(Biography)
Vice President, Global Sales and Marketing
Multitest Electronics Systems

 
3:35pm-4:00pm Assembling the Wrong die! A Quality Issue in the Wings
(Presentation in PDF)

Charlie Weinberger (Biography)
Project Manager, Test Technology and Product Engineering Group
Texas Instruments
 
Session Moderator:
Ron Leckie (Biography)
President
INFRASTRUCTURE Advisors

 

 

 

Please check back frequently for updates and more information as agendas develop and speakers are announced.

 

View Schedule of Events

 

 

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