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Test in Transition: Changing Customer Requirements
Tuesday, July 12
2:00pm-4:30pm
NorthTwo TechXPOT
Hosted by the SEMI Collaborative Alliance for Semiconductor Test (CAST)
| Description | Technology marches forward creating new technical and economic challenges for semiconductor test. New chip designs and applications in mobile communications, energy, automotive and consumer electronics demand cost effective test solutions that meet increasingly stringent cost-of-test goals while resolving the technical challenges. At the same time, IDMs and OSATS are deploying new test methodologies, purchasing practices, and supply chain demands on test suppliers. These presentations will explore and examine the changing market environment for test, focusing on real needs and requirements. |
| Agenda | ||
| 2:00pm-2:30pm |  |
Test Economics: Who is Winning? Risto Puhakka (Biography) |
| 2:30pm-3:00pm |  |
The Change in the Test Challenge Dale Ohmart (Biography) |
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| 3:00pm-3:30pm |  |
3DIC Test Challenges CJ Clark (Biography) President and CEO |
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| 3:30pm-4:00pm |
Test in Transition: An OSAT Perspective Roger Hwang |
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| 4:00pm-4:30pm |  |
Critical Test Needs At Qualcomm
Presentation not available Octavio Martinez (Biography) Senior Director, Engineering |
| 4:30pm |
IEEE Best Paper on Test Award Presentation The Institute of Electrical and Electronic Engineers (IEEE) and the Test Technology Technical Council (TTTC) created an award recognizing the year's best paper in the area of Automated Test Equipment (ATE) across all IEEE sponsored conferences and journals, named the ATE Vision 2020 Best Paper Award. The purpose of the award is to stimulate and recognize breakthrough innovations in the area of ATE across the industry but also across academia. |
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| Session Moderator: | Ron Leckie, INFRASTRUCTURE Advisors | |
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