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North Hall |
Tuesday, July 13, 2010, 2:00pm–4:30pm
3D IC Co-design Challenges: How to Speed 3D IC Deployment |
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3D-ICs with TSV interconnects are in the early phases of commercialization with the stage set for explosive growth. Image sensors have already ramped to high volume production. Early shipments of memory devices have now started. The advantages of deploying 3D-IC w/ TSV are clear; increased speed, lower power and higher density are the desired outcome. As the industry strives to reach these lofty goals, a few speed bumps have been encountered. One such struggle exists with the design tools that many of us have used for decades. 3D-IC w/TSV now requires additional attention to detail for semiconductor design and fabrication through package design and fabrication. This session will explore these new requirements and the issues that we’ve encountered that are slowing the successful adoption of high volume heterogeneous IC stacks. |
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2:00pm–2:05pm |
Welcome
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2:05pm–2:25pm
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3D/TSV – By Design
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2:25pm–2:45pm
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3D Planning and Prototyping Makes a Difference
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2:45pm–3:05pm
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Enabling 3D-IC Silicon Realization
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3:05pm–3:25pm
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Robust Verificaton of 3D-ICs
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3:25pm–3:50pm
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Reliability
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3:50pm–4:15pm
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Multi-core 3D Processors
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4:15pm–4:30pm
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Closing Remarks, Future Requirements and Issues
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